Unified characterization of RTN and BTI for circuit performance and variability simulation. - Nuria Ayala; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Xavier Aymerich (ESSDERC, 2012)

Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs. - Nuria Ayala; Javier Martín-Martínez; Rosana Rodríguez; M. B. González; Montserrat Nafría; Xavier Aymerich; Eddy Simoen (Microelectron. Reliab., 2012)