Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS. - Nuria Torres Matabosch; Mehmet Kaynak; Fabio Coccetti; Matthias Wietstruck; Bernd Tillack; Jean Louis Cazaux (Microelectron. Reliab., 2012)

Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process. - Nuria Torres Matabosch; Fabio Coccetti; Mehmet Kaynak; Beatrice Espana; Bernd Tillack; Jean-Louis Cazaux (Microelectron. Reliab., 2013)