Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique. - O. Benzaim; Kamel Haddadi; M. M. Wang; M. Maazi; David Glay; Tuami Lasri (IEEE Trans. Instrum. Meas., 2008)

Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks. - M. Maazi; O. Benzaim; David Glay; Tuami Lasri (IEEE Trans. Instrum. Meas., 2008)