Light emission from Si/SiO2 superlattices fabricated by RPECVD. - R. Rölver; O. Winkler; Michael Först; B. Spangenberg; H. Kurz (Microelectron. Reliab., 2005)

Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation. - V. I. Turchanikov; A. N. Nazarov; V. S. Lysenko; V. Ostahov; O. Winkler; B. Spangenberg; H. Kurz (Microelectron. Reliab., 2007)