Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. - Octavian Petre; Hans G. Kerkhoff (IOLTW, 2001)

On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. - Octavian Petre; Hans G. Kerkhoff (Asian Test Symposium, 2002)

Scan test strategy for asynchronous-synchronous interfaces [SoC testing]. - Octavian Petre; Hans G. Kerkhoff (ETW, 2003)

Accurate tap-delay measurements using a di .erential oscillation technique. - Octavian Petre; H. G. Kerkho (ETS, 2004)

Scan Test Strategy for Asynchronous-Synchronous Interfaces. - Octavian Petre; Hans G. Kerkhoff (J. Electron. Test., 2004)