Investigating the effects of transient faults in Programmable Capacitor Arrays. - Tiago R. Balen; Guilherme Schwanke Cardoso; Odair Lelis Gonçalez; Marcelo Soares Lubaszewski (LATW, 2011)

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. - Guilherme Schwanke Cardoso; Tiago R. Balen; Marcelo Soares Lubaszewski; Rafael Galhardo Vaz; Odair Lelis Goncalez (LATW, 2012)

The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory. - Evaldo Carlos Fonseca Pereira; Odair Lelis Goncalez; Rafael Galhardo Vaz; Claudio Antonio Federico; Thiago Hanna Both; Gilson Inácio Wirth (LATW, 2014)

Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects. - Lucas A. Tambara; Jorge L. Tonfat; Ricardo Reis 001; Fernanda Lima Kastensmidt; Evaldo Carlos Fonseca Pereira; Rafael Galhardo Vaz; Odair Lelis Goncalez (LATW, 2014)

Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell. - Alexandre Simionovski; Rafael Galhardo Vaz; Odair Lelis Goncalez; Gilson I. Wirth (J. Electron. Test., 2015)

Rail to rail radiation hardened operational amplifier in standard CMOS technology with standard layout techniques. - Peterson R. Agostinho; Odair Lelis Goncalez; Gilson I. Wirth (Microelectron. Reliab., 2016)

Evaluation of a mixed-signal design diversity system under radiation effects. - Carlos J. González; Cristiano P. Chenet; Matheus Budelon; Rafael Galhardo Vaz; Odair Lelis Goncalez; Tiago R. Balen (LATS, 2017)

Influence of sampling frequency on TID response of SAR ADCs. - Bruno L. Costa; Carlos J. González; Rafael Galhardo Vaz; Odair Lelis Gonçalez; Tiago R. Balen (LATS, 2020)

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. - Carlos J. González; Bruno L. Costa; Diego N. Machado; Rafael Galhardo Vaz; Alexis C. Vilas Bôas; Odair Lelis Gonçalez; Helmut Puchner; Fernanda Lima Kastensmidt; Nilberto H. Medina; Marcilei Aparecida Guazzelli; Tiago Roberto Balen (J. Electron. Test., 2021)