Impact of mechanical strain on wakeup of HfO2 ferroelectric memory. - Anastasiia Kruv; Sean R. C. McMitchell; Sergiu Clima; Oguzhan O. Okudur; Nicolo Ronchi; Geert Van den Bosch; Mario Gonzalez; Ingrid De Wolf; Jan Van Houdt (IRPS, 2021)

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress. - Kookjin Lee; Ben Kaczer; Anastasiia Kruv; Mario Gonzalez; Geert Eneman; Oguzhan O. Okudur; Alexander Grill; Jacopo Franco; Andrea Vici; Robin Degraeve; Ingrid De Wolf (IRPS, 2022)

Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI Degradation. - K. Vishwakarma; K. Lee; Anastasiia Kruv; Adrian Vaisman Chasin; Michiel J. van Setten; C. Pashartis; Oguzhan O. Okudur; M. Gonzalez; Nouredine Rassoul; A. Belmonte; Bem Kaczer (IRPS, 2025)