RTN and LFN Noise Performance in Advanced FDSOI Technology. - Luca Pirro; Olaf Zimmerhackl; Alban Zaka; Lars Müller-Meskamp; Ranjith Nelluri; Tom Hermann; Ignasi Cortes-Mayol; Andreas Huschka; Michael Otto 003; E. Nowak; Anurag Mittal; Jan Hoentschel (ESSDERC, 2018)

Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. - Luca Pirro; Alban Zaka; Olaf Zimmerhackl; T. Hermann; Michael Otto 003; E. M. Bazizi; Jan Hoentschel; X. Li; R. Taylor (IRPS, 2019)

Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices. - Luca Pirro; Aarthi Jayakumar; Olaf Zimmerhackl; Dieter Lipp; Ralf Illgen; Armin Muehlhoff; Ronny Pfuetzner; Alban Zaka; Michael Otto 003; Jan Hoentschel; Yannick Raffel; Konrad Seidel; et al. (IRPS, 2021)

Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. - Luca Pirro; P. Liebscher; C. Brantz; M. Kessler; H. Herzog; Olaf Zimmerhackl; R. Jain; E. Ebrand; K. Gebauer; Michael Otto 003; Alban Zaka; Jan Hoentschel (IRPS, 2022)