Improving the SiGeAsTe Ovonic Threshold Switching (OTS) Characteristics by Microwave Annealing for Excellent Endurance (> 1011) and Low Drift Characteristics. - Jangseop Lee; Seonghun Kim; Sangmin Lee; Sanghyun Ban; Seongjae Heo; Donghwa Lee; Oleksandr Mosendz; Hyunsang Hwang (VLSI Technology and Circuits, 2022)