GaN virtual prototyping: From traps modeling to system-level cascode optimization. - Gilberto Curatola; Andreas Kassmanhuber; Sergey Yuferev; Jörg Franke; Gianmauro Pozzovivo; Simone Lavanga; Gerhard Prechtl; Thomas Detzel; Oliver Haeberlen (ESSDERC, 2014)

Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale. - Sören Hommel; Nicole Killat; Andreas Altes; Thomas Schweinböck; Doris Schmitt-Landsiedel; Marco Silvestri; Oliver Haeberlen (Microelectron. Reliab., 2016)

Charge Injection in Normally-Off p-GaN Gate AlGaN/GaN-on-Si HFETs. - Luca Sayadi; Giuseppe Iannaccone; Sebastien Sicre; Simone Lavanga; Gianluca Fiori; Oliver Haeberlen; Gilberto Curatola (ESSDERC, 2018)

System-Level Assessment of Dynamic Effects in GaN-based Power Converters. - Andrea Minetto; Bernd Deutschmann; Oliver Häberlen; Gilberto Curatola (PRIME, 2019)

System-level evaluation of dynamic effects in a GaN-based class-E power amplifier. - Andrea Minetto; Bernd Deutschmann; Oliver Häberlen; Gilberto Curatola (Integr., 2020)

A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. - D. Wieland; Sybille Ofner; Manuel Stabentheiner; Boris Butej; Christian Koller; J. Sun; Andrea Minetto; Korbinian Reiser; Oliver Häberlen; Michael Nelhiebel; Michael Glavanovics; Dionyz Pogany; et al. (IRPS, 2023)