From Emergence to Prevalence: 22FDX® Embedded STT-MRAM. - Johannes Müller; Aleksandra Titova; Hongsik Yoon; Thomas Merbeth; Martin Weisheit; Georg Wolf; Sanjeeb Bharali; Bert Pfefferling; Yuichi Otani; Tetyana Shapoval; Alberto Cagliani; Ferenc Vajda; et al. (IMW, 2022)

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. - Vinayak Bharat Naik; J. H. Lim; Kazutaka Yamane; J. Kwon; Behin-Aein B.; N. L. Chung; S. K 001; R. Chao; C. Chiang; Y. Huang; L. Pu; Yuichi Otani; et al. (IRPS, 2022)