Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions. - Maximilian Lederer; Franz Müller 001; Raik Hoffmann; Ricardo Olivo; Yannick Raffel; Shouzhuo Yang; Sourav De 002; Roman Potjan; Oliver Ostien; Abdelrahman Altawil; Ayse Sünbül; David Lehninger; et al. (IMW, 2024)

Ferroelectric FETs as Embedded NVRAM Supporting Cryogenic Quantum Processors. - Shouzhuo Yang; Yannick Raffel; Ricardo Olivo; Franz Müller 001; Raik Hoffmann; David Lehninger; Oliver Ostien; Maik Simon; Konrad Seidel; Thomas Kämpfe; Maximilian Lederer; Gerald Gerlach (NVMTS, 2024)

Defect Dynamics and Flicker Noise in Ferroelectric Field Effect Transistors at Cryogenic Temperatures. - Shouzhuo Yang; Yannick Raffel; Ricardo Olivo; Raik Hoffmann; David Lehninger; Oliver Ostien; Maik Simon; Konrad Seidel; Thomas Kämpfe; Maximilian Lederer; Gerald Gerlach (IRPS, 2025)