Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. - Robert Entner; Tibor Grasser; Oliver Triebl; Hubert Enichlmair; Rainer Minixhofer (Microelectron. Reliab., 2007)

Interface traps density-of-states as a vital component for hot-carrier degradation modeling. - Stanislav Tyaginov; Ivan A. Starkov; Oliver Triebl; Johann Cervenka; C. Jungemann; Sara Carniello; Jong Mun Park; Hubert Enichlmair; Markus Karner; Ch. Kernstock; Ehrenfried Seebacher; Rainer Minixhofer; et al. (Microelectron. Reliab., 2010)