Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability. - Olivia Bluder; Michael Glavanovics; Jürgen Pilz (Microelectron. Reliab., 2011)

Modeling fatigue life of power semiconductor devices with ε-N fields. - Olivia Bluder; Kathrin Plankensteiner; Michael Nelhiebel; Walther Heinz; Christian Leitner (WSC, 2014)

Modeling and prediction of smart power semiconductor lifetime data using a gaussian process prior. - Kathrin Plankensteiner; Olivia Bluder; Jürgen Pilz (WSC, 2014)

Device level maverick screening: detection of risk devices through independent component analysis. - Anja Zernig; Olivia Bluder; Jürgen Pilz; Andre Kästner (WSC, 2014)

Markov random fields for pattern extraction in analog wafer test data. - Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kästner; Roman Kern (IPTA, 2017)

Quantification and Prediction of Damage in SAM Images of Semiconductor Devices. - Dzenana Alagic; Olivia Bluder; Jürgen Pilz (ICIAR, 2018)

A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data. - Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kästner; Roman Kern (ICMLA, 2018)