Yield Enhancement Methodology for CMOS Standard Cells. - Arnaud Epinat; N. Vijayaraghavan; Matthieu Sautier; Olivier Callen; Sebastien Fabre; Ryan Ross; Paul Simon; Robin Wilson (ISQED, 2006)

A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter. - Brice Lhomme; Yann Carminati; Bertrand Borot; Olivier Callen; Thierry Burdeau; Sylvain Clerc (ESSCIRC, 2010)

RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. - Joseph Nguyen; David Turgis; David Bonciani; Brice Lhomme; Yann Carminati; Olivier Callen; Guillaume Guirleo; Lorenzo Ciampolini; Gérard Ghibaudo (NATW, 2016)

40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode. - Kedar Janardan Dhori; Promod Kumar; Christophe Lecocq; Pascal Urard; Olivier Callen; Florian Cacho; Maryline Parra; Prashant Pandey; Daniel Noblet (VLSID, 2022)