Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components. - Olivier Fruchier; Petru Notingher Jr.; Serge Agnel; Alain Toureille; F. Forest; S. Cunningham; Bernard Rousset; Jean-Louis Sanchez (IAS, 2007)

Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. - Ludovic Boyer; Olivier Fruchier; Petru Notingher Jr.; Serge Agnel; Alain Toureille; Bernard Rousset; Jean-Louis Sanchez (IAS, 2008)

Measurement of the I(V) characteristics of photovoltaic arrays by the capacitive load method for fault detection. - Abdelhadi Benzagmout; Thierry Martiré; Gilles Beaufils; Olivier Fruchier; Thierry Talbert; Dorian Gachon (ICIT, 2018)

Modelling a redefined architecture for concentrated photovoltaic power plant. - Thierry Talbert; Frédérik Thiery; Dorian Gachon; Olivier Fruchier; Thierry Martiré; Mikael Petit (EBCCSP, 2019)