Strong electron irradiation hardness of 852 nm Al-free laser diodes. - Mathieu Boutillier; Olivier Gauthier-Lafaye; S. Bonnefont; F. Lozes-Dupuy; F.-J. Vermersch; M. Krakowski; Olivier Gilard (Microelectron. Reliab., 2006)

Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. - M. L. Bourqui; Laurent Béchou; Olivier Gilard; Yannick Deshayes; Pamela Del Vecchio; L. S. How; F. Rosala; Yves Ousten; André Touboul (Microelectron. Reliab., 2008)

Analytical model for multi-junction solar cells prediction in space environment. - A. Gauffier; Jean-Pierre David; Olivier Gilard (Microelectron. Reliab., 2008)

New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. - David Veyrié; Olivier Gilard; Kevin Sanchez; Sébastien Lhuillier; Frédéric Bourcier (Microelectron. Reliab., 2010)

An original DoE-based tool for silicon photodetectors EoL estimation in space environments. - Piero Spezzigu; Laurent Béchou; Gianandrea Quadri; Olivier Gilard; Yves Ousten; Massimo Vanzi (Microelectron. Reliab., 2011)

Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. - Jérémy Michaud; Guillaume Pedroza; Laurent Béchou; L. S. How; Olivier Gilard; David Veyrié; F. Laruelle; Stéphane Grauby (Microelectron. Reliab., 2015)

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. - Laurent Artola; Ahmad Al Youssef; Samuel Ducret; Franck Perrier; Raphael Buiron; Olivier Gilard; Julien Mekki; Mathieu Boutillier; Guillaume Hubert; Christian Poivey (Sensors, 2018)