An Overview of Failure Mechanisms in Embedded Flash Memories. - Olivier Ginez; Jean Michel Daga; Marylene Combe; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel (VTS, 2006)

Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. - Olivier Ginez; Jean Michel Daga; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel (ETS, 2007)

A concurrent approach for testing address decoder faults in eFlash memories. - Olivier Ginez; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel; Jean Michel Daga (ITC, 2007)

Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. - Olivier Ginez; Jean Michel Daga; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel (VTS, 2007)

A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. - Olivier Ginez; Jean-Michel Portal; Hassen Aziza (ITC, 2008)

A Novel Low Power Oriented Design Methodology for Analog Blocks. - Hassen Aziza; Emmanuel Bergeret; Jean-Michel Portal; Olivier Ginez (J. Low Power Electron., 2008)

An on-line testing scheme for repairing purposes in Flash memories. - Olivier Ginez; Jean-Michel Portal; Hassen Aziza (DDECS, 2009)

Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. - Olivier Ginez; Jean-Michel Portal; Christophe Muller (ETS, 2009)

A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash. - Olivier Ginez; Jean Michel Daga; Patrick Girard 001; Christian Landrault; Serge Pravossoudovitch; Arnaud Virazel (J. Electron. Test., 2009)

Design challenges for prototypical and emerging memory concepts relying on resistance switching. - Christophe Muller; Damien Deleruyelle; Olivier Ginez; Jean-Michel Portal; Marc Bocquet (CICC, 2011)