Requirements for delay testing of look-up tables in SRAM-based FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (ETW, 2003)

Defect Analysis for Delay-Fault BIST in FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (IOLTS, 2003)

High Quality TPG for Delay Faults in Look-Up Tables of FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (DELTA, 2004)

Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (ETS, 2004)

BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (IOLTS, 2004)

On the Reliability Evaluation of SRAM-Based FPGA Designs. - Olivier Héron; Talal Arnaout; Hans-Joachim Wunderlich (FPL, 2005)

Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (J. Electron. Test., 2005)

An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs. - Patrick Girard 001; Olivier Héron; Serge Pravossoudovitch; Michel Renovell (J. Electron. Test., 2006)

Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies. - Olivier Héron; Julien Guilhemsang; Nicolas Ventroux; Alain Giulieri (IOLTS, 2010)

High Level Power and Energy Exploration Using ArchC. - Tushar Gupta; Clement Bertolini; Olivier Héron; Nicolas Ventroux; Thomas Zimmer; François Marc (SBAC-PAD, 2010)

Impact of power management on temperature and reliability evolution for an embedded many-core architecture. - M. Alexandre Carbon; Olivier Héron; Karim Ben Chehida; Raphaël David (ARCS Workshops, 2011)

A Lightweight API for an Adaptive Software Fault Tolerance Using POSIX-Thread Replication. - Abdellah Kouadri; Olivier Héron; Romain Montagné (ARCS Workshops, 2011)

Impact of the application activity on intermittent faults in embedded systems. - Julien Guilhemsang; Olivier Héron; Nicolas Ventroux; Olivier Goncalves; Alain Giulieri (VTS, 2011)

Relation between HCI-induced performance degradation and applications in a RISC processor. - Clement Bertolini; Olivier Héron; Nicolas Ventroux; François Marc (IOLTS, 2012)

Impact of Power Consumption and Temperature on Processor Lifetime Reliability. - Tushar Gupta; Clement Bertolini; Olivier Héron; Nicolas Ventroux; Thomas Zimmer; François Marc (J. Low Power Electron., 2012)

When processors get old: Evaluation of BTI and HCI effects on performance and reliability. - Chiara Sandionigi; Olivier Héron; Clement Bertolini; Raphaël David (IOLTS, 2013)

On the Simulation of HCI-Induced Variations of IC Timings at High Level. - Olivier Héron; Clement Bertolini; Chiara Sandionigi; Nicolas Ventroux; François Marc (J. Electron. Test., 2013)

Identifying aging-aware representative paths in processors. - Chiara Sandionigi; Olivier Héron (IOLTS, 2015)

Workload-dependent BTI analysis in a processor core at high level. - Olivier Héron; Chiara Sandionigi; E. Piriou; Safa Mbarek; Vincent Huard (IRPS, 2015)

Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor. - Maurício Altieri; Suzanne Lesecq; Diego Puschini; Olivier Héron; Edith Beigné; Jorge Rodas (PATMOS, 2015)

Fine-grain analysis of the parameters involved in aging of digital circuits. - Boukary Ouattara; Olivier Héron; Chiara Sandionigi (IOLTS, 2016)

Tracking BTI and HCI effects at circuit-level in adaptive systems. - Maurício Altieri; Suzanne Lesecq; Edith Beigné; Olivier Héron; Diego Puschini (NEWCAS, 2016)

Early estimation of aging in the design flow of integrated circuits through a programmable hardware module. - Chiara Sandionigi; Maurício Altieri; Olivier Héron (DFT, 2017)

Estimation of oxide breakdown effects by fault injection. - Chiara Sandionigi; Olivier Héron (IOLTS, 2019)

Towards Privacy-first Manufacturing Data Exchange Platform. - Thanh-Hai Nguyen; Olivier Héron; Olivier Riou (SoICT, 2023)