A Fast Method for Modeling and Optimizing Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors. - Federico Pace; Olivier Marcelot; Philippe Martin-Gonthier; Olivier Saint-Pé; Michel Breart de Boisanger; Rose-Marie Sauvage; Pierre Magnan (ESSDERC, 2019)

Dark Count Rate Modeling in Single-Photon Avalanche Diodes for Space LIDAR Applications. - Aymeric Panglosse; Philippe Martin-Gonthier; Olivier Marcelot; Cédric Virmontois; Olivier Saint-Pé; Pierre Magnan (NEWCAS, 2019)

Performance Parameters Modeling and Simulation of Single-Photon Avalanche Diodes for Space LIDAR Applications. - Aymeric Panglosse; Philippe Martin-Gonthier; Olivier Marcelot; Cédric Virmontois; Olivier Saint-Pé; Pierre Magnan (PRIME, 2019)

Modeling of Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors. - Federico Pace; Olivier Marcelot; Philippe Martin-Gonthier; Olivier Saint-Pé; Michel Breart de Boisanger; Rose-Marie Sauvage; Pierre Magnan (SMACD, 2019)

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. - Alexandre Le Roch; Vincent Goiffon; Olivier Marcelot; Philippe Paillet; Federico Pace; Jean-Marc Belloir; Pierre Magnan; Cédric Virmontois (Sensors, 2019)

Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process. - Célestin Doyen; Stéphane Ricq; Pierre Magnan; Olivier Marcelot; Marios Barlas; Sébastien Place (Sensors, 2020)

Dark Count Rate Modeling in Single-Photon Avalanche Diodes. - Aymeric Panglosse; Philippe Martin-Gonthier; Olivier Marcelot; Cédric Virmontois; Olivier Saint-Pé; Pierre Magnan (IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 2020)

Modeling, Simulation Methods and Characterization of Photon Detection Probability in CMOS-SPAD. - Aymeric Panglosse; Philippe Martin-Gonthier; Olivier Marcelot; Cédric Virmontois; Olivier Saint-Pé; Pierre Magnan (Sensors, 2021)

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging. - Olivier Marcelot; Marjorie Morvan; Antoine Salih Alj; Stephane Demiguel; Cédric Virmontois; Anne Rouvié; Magali Estribeau; Vincent Goiffon (Sensors, 2023)

Effect of Metallic Ion Implantation on Dark Current Distributions of Silicon-Based CMOS Image Sensors. - Juan Esteban Montoya Cardona; Sylvain Joblot; Pierre Kermagoret; Grégoire Ducotey; Stéphane Hardillier; Guillaume Dupeux; Yannick Borde; Jean-Pierre Carrère; Sandrine Lhostis; Richard Monflier; Olivier Marcelot; Vincent Goiffon (IEEE SENSORS, 2024)

Radiation Damage on Silicon Photomultipliers from Ionizing and Non-Ionizing Radiation of Low-Earth Orbit Operations. - Stefano Merzi; Fabio Acerbi; Corinne Aicardi; Daniela Fiore; Vincent Goiffon; Alberto Giacomo Gola; Olivier Marcelot; Alex Materne; Olivier Saint-Pé (Sensors, 2024)