Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. - P. Benoit; Jérémy Raoult; C. Delseny; Fabien Pascal; L. Snadny; J. C. Vildeuil; M. Marin; B. Martinet; D. Cottin; Olivier Noblanc (Microelectron. Reliab., 2005)

High voltage devices in advanced CMOS technologies. - Raúl Andrés Bianchi; Christine Raynaud; Floria Blanchet; Frederic Monsieur; Olivier Noblanc (CICC, 2009)