mm-Wave Through-Load Element for On-Wafer Measurement Applications. - Marc Margalef-Rovira; Olivier Occello; Abdelhalim A. Saadi; Vanessa Avramovic; Sylvie Lépilliet; Loic Vincent; Manuel J. Barragán; Emmanuel Pistono; Sylvain Bourdel; Christophe Gaquière; Philippe Ferrari (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests. - Olivier Occello; Marc Margalef-Rovira; Manuel J. Barragan Asian; C. Durand; A. Rhellab; Loic Vincent; Jordan Corsi; Sylvie Lépilliet; G. Ducournau; P. Ferrari (NewCAS, 2024)