Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. - F. Saigné; Olivier Quittard; Laurent Dusseau; F. Joffre; Coumar Oudéa; J. Fesquet; Jean Gasiot (Microelectron. Reliab., 2002)

ESD robust high-voltage active clamps. - Guido Notermans; Olivier Quittard; Anco Heringa; Zeljko Mrcarica; Fabrice Blanc; Hans van Zwol; Theo Smedes; Thomas Keller 004; Peter C. de Jong (Microelectron. Reliab., 2009)

Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis. - Th. Stiasny; Olivier Quittard; Daniel Waltisberg; U. Meier (Microelectron. Reliab., 2018)