Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation. - Octavian Buiu; Steve Hall; Olof Engström; B. Raeissi; Max Christian Lemme; Paul K. Hurley; Karim Cherkaoui (Microelectron. Reliab., 2007)

The influence of inhomogeneous trap distribution on results of DLTS study. - Mariusz Kaczmarczyk; Maria Kaniewska; Olof Engström (Microelectron. Reliab., 2011)

Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. - Olof Engström; Henryk M. Przewlocki; Ivona Z. Mitrovic; Stephen Hall (ESSDERC, 2014)

Redefining Responsivity in Graphene-based Schottky Diodes. - S. Riazimeher; Satender Kataria; J. M. Gonzalez; M. Shaygan; Stephan Suckow; Olof Engström; F. J. G. Ruiz; A. Godoy; Max Christian Lemme (DRC, 2018)

Large Scale MoS2/Si Photodiodes with Graphene Transparent Electrodes. - Melkamu Belete; Satender Kataria; Sarah Riazimehr; Gunther Lippert; Mindaugas Lukosius; Daniel S. Schneider 001; Andreas Bablich; Olof Engström; Max Christian Lemme (ESSDERC, 2019)