Reliability Challenges with Self-Heating and Aging in FinFET Technology. - Hussam Amrouch; Victor M. van Santen; Om Prakash 007; Hammam Kattan; Sami Salamin; Simon Thomann; Jörg Henkel (IOLTS, 2019)

Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. - Victor M. van Santen; Paul R. Genssler; Om Prakash 007; Simon Thomann; Jörg Henkel; Hussam Amrouch (ASP-DAC, 2020)

Impact of NBTI Aging on Self-Heating in Nanowire FET. - Om Prakash 007; Hussam Amrouch; Sanjeev Manhas; Jörg Henkel (DATE, 2020)

Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. - Kai Ni 004; Aniket Gupta; Om Prakash 007; Simon Thomann; Xiaobo Sharon Hu; Hussam Amrouch (IRPS, 2020)

Impact of Radiation on Negative Capacitance FinFET. - Govind Bajpai; Aniket Gupta; Om Prakash 007; Girish Pahwa; Jörg Henkel; Yogesh Singh Chauhan; Hussam Amrouch (IRPS, 2020)

Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET. - Aniket Gupta; Kai Ni 004; Om Prakash 007; Xiaobo Sharon Hu; Hussam Amrouch (IRPS, 2020)

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. - Hussam Amrouch; Girish Pahwa; Amol D. Gaidhane; Chetan K. Dabhi; Florian Klemme; Om Prakash 007; Yogesh Singh Chauhan (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)

Variability Effects in FinFET Transistors and Emerging NC-FinFET. - Aniket Gupta; Nitanshu Chauhan; Om Prakash 007; Hussam Amrouch (ICICDT, 2021)

Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. - Aniket Gupta; Govind Bajpai; Priyanshi Singhal; Navjeet Bagga; Om Prakash 007; Shashank Banchhor; Hussam Amrouch; Nitanshu Chauhan (IRPS, 2021)

Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. - Om Prakash 007; Chetan K. Dabhi; Yogesh Singh Chauhan; Hussam Amrouch (VTS, 2021)

On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. - Simon Thomann; Chao Li 065; Cheng Zhuo; Om Prakash 007; Xunzhao Yin; Xiaobo Sharon Hu; Hussam Amrouch (VTS, 2021)

Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology. - Om Prakash 007; Nitanshu Chauhan; Aniket Gupta; Hussam Amrouch (Microelectron. J., 2021)

Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. - Navjeet Bagga; Kai Ni 004; Nitanshu Chauhan; Om Prakash 007; X. Sharon Hu; Hussam Amrouch (IRPS, 2022)

Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications. - Kai Ni 004; Om Prakash 007; Simon Thomann; Zijian Zhao 001; Shan Deng; Hussam Amrouch (IRPS, 2022)

Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing. - Om Prakash 007; Kai Ni 004; Hussam Amrouch (IRPS, 2022)

Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness. - Om Prakash 007; Kai Ni 004; Hussam Amrouch (IRPS, 2023)

Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. - Om Prakash 007; Rodion Novkin; Virinchi Roy Surabhi; Prashanth Krishnamurthy; Ramesh Karri; Farshad Khorrami; Hussam Amrouch (ISCAS, 2023)