A Method for Generating Weighted Random Test Patterns. - John A. Waicukauski; Eric Lindbloom; Edward B. Eichelberger; Orazio P. Forlenza (IBM J. Res. Dev., 1989)

Weighted random test program generation for a per-pin tester. - Jeff Gartner; B. Driscoll; Donato O. Forlenza; Orazio P. Forlenza; Timothy J. Koprowski; T. Lizambri; R. Olsen; S. Robertson; P. Ryan; A. Walter (ITC, 1990)

On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). - Franco Stellari; Peilin Song; John Sylvestri; D. Miles; Orazio P. Forlenza; Donato O. Forlenza (ITC, 2009)

Structural and functional test of IBM System z10 chips. - Gerard Salem; D. W. Wittig; Thomas G. Foote; Bryan J. Robbins; C. Hirko; Donato O. Forlenza; Franco Motika; J. A. Kyle; Mary P. Kusko; Orazio P. Forlenza; R. J. Frishmuth; Rona Yaari; et al. (IBM J. Res. Dev., 2009)

Testing the IBM Power 7™ 4 GHz eight core microprocessor. - James Crafts; David Bogdan; Dennis Conti; Donato O. Forlenza; Orazio P. Forlenza; William V. Huott; Mary P. Kusko; Edward Seymour; Timothy Taylor; Brian Walsh (ITC, 2010)