Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications. - Carlos Restrepo; Tine Konjedic; Cristian Guarnizo; Oriol Avino-Salvado; Javier Calvente; Alfonso Romero 001; Roberto Giral (IEEE Trans. Ind. Electron., 2014)

Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. - Wissam Sabbah; Faical Arabi; Oriol Avino-Salvado; Cyril Buttay; L. Théolier; Hervé Morel (Microelectron. Reliab., 2017)

High temperature ageing of microelectronics assemblies with SAC solder joints. - Wissam Sabbah; Pierre Bondue; Oriol Avino-Salvado; Cyril Buttay; Hélène Frémont; Alexandrine Guédon-Gracia; Hervé Morel (Microelectron. Reliab., 2017)

Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. - Oriol Avino-Salvado; Hervé Morel; Cyril Buttay; Denis Labrousse; Stéphane Lefebvre (Microelectron. Reliab., 2018)

VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate. - Besar Asllani; Alberto Castellazzi; Oriol Avino-Salvado; Asad Fayyaz; Hervé Morel; Dominique Planson (IRPS, 2019)

Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. - Miquel Vellvehí; Xavier Perpiñà; Javier Leon; Oriol Avino-Salvado; Conrad Ferrer; Xavier Jordà (IEEE Trans. Ind. Electron., 2021)

Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. - Conrad Ferrer; Oriol Avino-Salvado; Miquel Vellvehí; Xavier Jordà; Xavier Perpiñà (IEEE Trans. Instrum. Meas., 2023)

Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging. - Roger Solé; Conrad Ferrer; Oriol Avino-Salvado; Xavier Jordà; Xavier Perpiñà (IEEE Trans. Instrum. Meas., 2024)

Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. - Oriol Avino-Salvado; Cyril Buttay; Ferran Bonet; Christophe Raynaud; Pascal Bevilacqua; José Rebollo; Hervé Morel; Xavier Perpiñà (IEEE Trans. Ind. Electron., 2024)