A System for Validating Resistive Neural Network Prototypes. - Brian Hoskins; Wen Ma; Mitchell Fream; Osama Yousuf; Matthew W. Daniels; Jonathan Goodwill; Advait Madhavan; Hoang Tung; Mark Branstad; Muqing Liu; Rasmus Madsen; Jabez J. McClelland; et al. (ICONS, 2021)

Neural Network Modeling Bias for Hafnia-based FeFETs. - Osama Yousuf; Imtiaz Hossen; Andreu Glasmann; Sina Najmaei; Gina C. Adam (NANOARCH, 2023)

Device Modeling Bias in ReRAM-Based Neural Network Simulations. - Osama Yousuf; Imtiaz Hossen; Matthew W. Daniels; Martin Lueker-Boden; Andrew M. Dienstfrey; Gina C. Adam (IEEE J. Emerg. Sel. Topics Circuits Syst., 2023)

Layer Ensemble Averaging for Improving Memristor-Based Artificial Neural Network Performance. - Osama Yousuf; Brian Hoskins; Karthick Ramu; Mitchell Fream; William A. Borders; Advait Madhavan; Matthew W. Daniels; Andrew M. Dienstfrey; Jabez J. McClelland; Martin Lueker-Boden; Gina C. Adam (CoRR, 2024)