Development of Surface Inspection Machine for Organic Photo Conductor(OPC). - Osamu Nakayama; Shinji Kobayashi; Katsuyuki Omura; Takahiro Asai; Mitsuhiro Tomoda; Teruki Kamada (MVA, 1994)

Testing DSM ASIC With Static, DeltaIDDQ, And Dynamic Test Suite: Implementation And Results. - Yoshihito Nishizaki; Osamu Nakayama; Chiaki Matsumoto; Yoshitaka Kimura; Toshimi Kobayashi; Hiroyuki Nakamura (ITC, 2003)