Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications. - Asifa Amin; Aarti Rathi; Sujit K. Singh; Abhisek Dixit; Oscar Huerta-Gonzalez; P. Srinivasan 002; Fernando Guarin (IRPS, 2022)

RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. - Aarti Rathi; Abhisek Dixit; P. Srinivasan 002; Oscar Huerta-Gonzalez; Fernando Guarin (IRPS, 2022)

Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. - Alan Y. Otero-Carrascal; Dora A. Chaparro-Ortiz; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002 (IRPS, 2024)

Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications. - Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002; Héctor Uribe (IRPS, 2025)