A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior. - Rao Desineni; Osei Poku; Ronald D. Blanton (ITC, 2006)

Extracting Defect Density and Size Distributions from Product ICs. - Jeffrey E. Nelson; Thomas Zanon; Jason G. Brown; Osei Poku; R. D. (Shawn) Blanton; Wojciech Maly; Brady Benware; Chris Schuermyer (IEEE Des. Test Comput., 2006)

Delay defect diagnosis using segment network faults. - Osei Poku; Ronald D. Blanton (ITC, 2007)

Precise failure localization using automated layout analysis of diagnosis candidates. - Wing Chiu Tam; Osei Poku; R. D. (Shawn) Blanton (DAC, 2008)

Physically-Aware N-Detect Test Pattern Selection. - Yen-Tzu Lin; Osei Poku; Naresh K. Bhatti; Ronald D. Blanton (DATE, 2008)

Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. - Yen-Tzu Lin; Osei Poku; Ronald D. Blanton; Phil Nigh; Peter Lloyd; Vikram Iyengar (ITC, 2008)

Automated failure population creation for validating integrated circuit diagnosis methods. - Wing Chiu Tam; Osei Poku; R. D. (Shawn) Blanton (DAC, 2009)

Controlling DPPM through Volume Diagnosis. - Xiaochun Yu; Yen-Tzu Lin; Wing Chiu Tam; Osei Poku; Ronald D. Blanton (VTS, 2009)

Systematic defect identification through layout snippet clustering. - Wing Chiu Tam; Osei Poku; Ronald D. Blanton (ITC, 2010)

Test-data volume optimization for diagnosis. - Hongfei Wang; Osei Poku; Xiaochun Yu; Sizhe Liu; Ibrahima Komara; Ronald D. Blanton (DAC, 2012)

Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. - R. D. (Shawn) Blanton; Wing Chiu Tam; Xiaochun Yu; Jeffrey E. Nelson; Osei Poku (IEEE Des. Test Comput., 2012)

Physically-Aware N-Detect Test. - Yen-Tzu Lin; Osei Poku; R. D. (Shawn) Blanton; Phil Nigh; Peter Lloyd; Vikram Iyengar (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

PADRE: Physically-Aware Diagnostic Resolution Enhancement. - Yang Xue; Osei Poku; Xin Li 001; Ronald D. Blanton (ITC, 2013)