A SmartBIST Variant with Guaranteed Encoding. - Bernd Könemann; Carl Barnhart; Brion L. Keller; Thomas J. Snethen; Owen Farnsworth; Donald L. Wheater (Asian Test Symposium, 2001)

OPMISR: the foundation for compressed ATPG vectors. - Carl Barnhart; Vanessa Brunkhorst; Frank Distler; Owen Farnsworth; Brion L. Keller; Bernd Könemann; Andrej Ferko (ITC, 2001)

On-Chip Repair and an ATE Independent Fusing Methodology. - Bruce Cowan; Owen Farnsworth; Peter Jakobsen; Steven F. Oakland; Michael Ouellette; Donald L. Wheater (ITC, 2002)

Extending OPMISR beyond 10x Scan Test Efficiency. - Carl Barnhart; Vanessa Brunkhorst; Frank Distler; Owen Farnsworth; Andrew Ferko; Brion L. Keller; David Scott; Bernd Könemann; Takeshi Onodera (IEEE Des. Test Comput., 2002)

An On-Chip Self-Repair Calculation and Fusing Methodology. - Darren Anand; Bruce Cowan; Owen Farnsworth; Peter Jakobsen; Steven F. Oakland; Michael Ouellette; Donald L. Wheater (IEEE Des. Test Comput., 2003)