Simulation of Rarefied Flows in MEMS Devices by Atomistic and Multiscale Methods - Ozgur Aktas (2001)

Reliability studies of vertical GaN devices based on bulk GaN substrates. - Isik C. Kizilyalli; P. Bui-Quang; Don Disney; H. Bhatia; Ozgur Aktas (Microelectron. Reliab., 2015)