Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. - Mourad Oualli; Christian Dua; O. Patard; P. Altuntas; S. Piotrowicz; Piero Gamarra; Cedric Lacam; J.-C. Jacquet; L. Teisseire; D. Lancereau; Eric Chartier; C. Potier; et al. (Microelectron. Reliab., 2018)

GaN/Si 37-40 GHz T/R Chip MMIC for 5G Communications. - M. El Kaamouchi; A. Gasmi; Bartosz Wróblewski; Rémy Leblanc; J. Poulain; P. Altuntas (BCICTS, 2023)