Commentaires sur une histoire de discrétisation. - P. Besse; André Carlier; Antoine de Falguerolles (Monde des Util. Anal. Données, 1993)

Determination of the ESD Failure Cause Through its Signature. - M. Zecri; P. Besse; Philippe Givelin; M. Nayrolles; Marise Bafleur; Nicolas Nolhier (Microelectron. Reliab., 2003)

Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression. - P. Besse; K. Abouda; C. Abouda (Microelectron. Reliab., 2011)