Testing process capability for one-sided specification limit with application to the voltage level translator. - P. C. Lin; Wen Lea Pearn (Microelectron. Reliab., 2002)

Testing process performance based on capability index Cpk with critical values. - Wen Lea Pearn; P. C. Lin (Comput. Ind. Eng., 2004)

Assessing non-normally distributed processes by interval estimation of the incapability index Cpp. - Jau-Chuan Ke; Yunn-Kuang Chu; Y.-T. Chung; P. C. Lin (Qual. Reliab. Eng. Int., 2009)

An investigation into warpages, stresses and keep-out zone in 3D through-silicon-via DRAM packages. - Ming-Yi Tsai; P. S. Huang; C. Y. Huang; P. C. Lin; Lawrence Huang; Michael Chang; Steven Shih; J. P. Lin (Microelectron. Reliab., 2014)