Process Window and Device Variations Evaluation using Array-Based Characterization Circuits. - C. Tabery; M. Craig; Gert Burbach; B. Wagner; S. McGowan; P. Etter; S. Roling; C. Haidinyak; E. Ehrichs (ISQED, 2006)

Open-loop and closed-loop high-end accelerometer platforms for high demanding applications. - Pascal Zwahlen; D. Balmain; S. Habibi; P. Etter; F. Rudolf; R. Brisson; Ph. Ullah; V. Ragot (PLANS, 2016)