Evidence for source side injection hot carrier effects on lateral DMOS transistors. - Stefano Aresu; Ward De Ceuninck; Geert Van den Bosch; Guido Groeseneken; Peter Moens; Jean Manca; D. Wojciechowski; P. Gassot (Microelectron. Reliab., 2004)

Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. - R. Charavel; Jaume Roig; S. Mouhoubi; P. Gassot; Filip Bauwens; Piet Vanmeerbeek; B. Desoete; Peter Moens; Eddy De Backer (Microelectron. Reliab., 2010)