Numerical prediction of failure paths at a roughened metal/polymer interface. - S. P. M. Noijen; Olaf van der Sluis; P. H. M. Timmermans; G. Q. Zhang (Microelectron. Reliab., 2009)

Numerical analysis of delamination and cracking phenomena in multi-layered flexible electronics. - Olaf van der Sluis; R. A. B. Engelen; P. H. M. Timmermans; G. Q. Zhang (Microelectron. Reliab., 2009)

Design and implementation of flexible and stretchable systems. - Mario Gonzalez; Bart Vandevelde; Wim Christiaens; Yung-Yu Hsu; François Iker; Frederick Bossuyt; Jan Vanfleteren; Olaf van der Sluis; P. H. M. Timmermans (Microelectron. Reliab., 2011)