A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. - A. Manzini; P. Inglese; L. Caldi; R. Cantero; G. Carnevale; M. Coppetta; M. Giltrelli; N. Mautone; F. Irrera; Rudolf Ullmann; Paolo Bernardi (ETS, 2019)