Study of dynamic TDDB in scaled FinFET technologies. - Kaustubh Joshi 003; Shu-Wen Chang; D. S. Huang; P. J. Liao; Yung-Huei Lee (IRPS, 2018)

A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. - Kaustubh Joshi 003; Yung-Huei Lee; Yu-Cheng Yao; Shu-Wen Chang; Siao-Syong Bian; P. J. Liao; Jiaw-Ren Shih; Min-Jan Chen (IRPS, 2019)

Composition Segregation of Ge-Rich GST and Its Effect on Reliability. - Yung-Huei Lee; P. J. Liao; Vincent Hou; Dawei Heh; Chih-Hung Nien; Wen-Hsien Kuo; Gary T. Chen; Shao-Ming Yu; Yu-Sheng Chen; Jau-Yi Wu; Xinyu Bao; Carlos H. Diaz (IRPS, 2021)

Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. - P. C. Chang; P. J. Liao; D. W. Heh; C. Lee; D. H. Hou; Elia Ambrosi; C. H. Wu; H. Y. Lee; J. H. Lee; Xinyu Bao (IRPS, 2022)

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics. - Y. K. Chang; P. J. Liao; S. H. Yeong; Y.-M. Lin; J. H. Lee; C. T. Lin; Z. Yu; Wilman Tsai; Paul C. McIntyre (IRPS, 2022)

A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. - P. C. Chang; P. J. Liao; C. H. Wu; Y. C. Chang; D. H. Hou; Elia Ambrosi; H. Y. Lee; J. H. Lee; X. Y. Bao (IRPS, 2023)

Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach. - H. C. Chang; P. J. Liao; S. H. Chen; Y. K. Chang; C. P. Li; W. C. Liao; M. H. Hsieh; H. W. Yang; J. H. Lee; C. M. Huang; Jun He (IRPS, 2024)

Refined High Resistance Baking Approaches for Optimal Interconnect Reliability. - H. C. Chang; Eliot Chen; P. J. Liao; J. H. Lee; Ryan Lu; Y. K. Hwang (IRPS, 2025)

Exploring AC Time-Dependent Dielectric Breakdown (TDDB) Through Frequency Noise Analysis. - Y. K. Chang; P. J. Liao; Y. C. Chang; C. H. Chou; Y. S. Liu; J. H. Lee; Ryan Lu; Y. K. Hwang (IRPS, 2025)