Accumulator based Test-per-Scan BIST. - P. Karpodinis; Dimitri Kagaris; Dimitris Nikolos (IOLTS, 2004)

On Obtaining Maximum-Length Sequences for Accumulator-Based Serial TPG. - Dimitrios Kagaris; P. Karpodinis; Dimitris Nikolos (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)