Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. - Luca Pirro; P. Liebscher; C. Brantz; M. Kessler; H. Herzog; Olaf Zimmerhackl; R. Jain; E. Ebrand; K. Gebauer; Michael Otto 003; Alban Zaka; Jan Hoentschel (IRPS, 2022)