Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise. - M. Marin; Y. Akue Allogo; M. de Murcia; P. Llinares; J. C. Vildeuil (Microelectron. Reliab., 2004)