Design of component reliability test plan for a series system having time dependent testing cost with the presence of covariates. - Mahesh Kumar; P. N. Bajeel (Comput. Stat., 2018)

Design of Optimal Bayesian Reliability Test Plans for a Parallel System Based on Type-II Censoring. - P. N. Bajeel; Mahesh Kumar (ICMC, 2020)

Application of degradation growth model in the estimation of Bayesian system reliability. - Mahesh Kumar; P. N. Bajeel; Om Prakash Yadav; K. C. Siju (Commun. Stat. Simul. Comput., 2022)