Numerical evaluation of integrals of analytic functions. - B. P. Acharya; P. Nayak (Int. J. Comput. Math., 1996)

Transistor aging and reliability in 14nm tri-gate technology. - Steven R. Novak; C. Parker; D. Becher; M. Liu; Marty Agostinelli; M. Chahal; P. Packan; P. Nayak; Stephen Ramey; S. Natarajan (IRPS, 2015)

Transistor reliability variation correlation to threshold voltage. - Stephen Ramey; M. Chahal; P. Nayak; Steven R. Novak; Chetan Prasad; Jeffery Hicks (IRPS, 2015)