Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. - Animesh Datta; Mohamed H. Abu-Rahma; Sachin Dileep Dasnurkar; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; Prasanna Seeram; Prasad Bhadri; et al. (ISQED, 2013)

Experiments and analysis to characterize logic state retention limitations in 28nm process node. - Sachin Dileep Dasnurkar; Animesh Datta; Mohamed H. Abu-Rahma; Hieu Nguyen; Martin Villafana; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; et al. (VTS, 2013)

High Performance 5G Mobile SOC Productization with 4nm EUV Fin-FET Technology. - Jun Yuan; Jie Deng; Vicki Lin; Ying Chen; Joseph Chiu; Minghuei Lin; Jun Chen; Deedee Zhang; Yukai Chen; David Liu; Bo Yu; Hao Wang; et al. (VLSI Technology and Circuits, 2023)