Charge trapping and reliability characteristics of ultra-thin HfYOx films on n-GaAs substrates. - P. S. Das; Abhijit Biswas (Microelectron. Reliab., 2010)

Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlOx on n-GaAs substrates. - P. S. Das; Abhijit Biswas (Microelectron. Reliab., 2012)