Comprehensive failure analysis of leakage faults in bipolar transistors. - Bernadette Domengès; P. Schwindenhammer; Patrick Poirier; Felix Beaudoin; Philippe Descamps (Microelectron. Reliab., 2002)

Determination of temperature change inside IC packages during laser ablation of molding compound. - P. Schwindenhammer; H. Murray; Philippe Descamps; Patrick Poirier (Microelectron. Reliab., 2008)