Screening of Hot Electron Effect During Plasma Processing. - P. Srinivasan 002; B. Vootukuru; Durga Misra (VLSI Design, 2004)

Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications. - P. Srinivasan 002; Andrew Marshall (SoCC, 2009)

Tool wear monitoring using artificial neural network based on extended Kalman filter weight updation with transformed input patterns. - Purushothaman Srinivasan (J. Intell. Manuf., 2010)

Noise and reliability in advanced CMOS devices for low power applications. - Purushothaman Srinivasan (SBCCI, 2011)

Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants. - Gilson I. Wirth; Dragica Vasileska; N. Ashraf; Lucas Brusamarello; R. Della Giustina; P. Srinivasan 002 (Microelectron. Reliab., 2012)

Voltage reference design using 1 V power supply in 0.13 µm CMOS technology. - Dalton M. Colombo; Gilson I. Wirth; Sergio Bampi; P. Srinivasan 002 (LASCAS, 2013)

Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices. - Shimpei Yamaguchi; Zeynel Bayindir; Xiaoli He; Suresh Uppal; Purushothaman Srinivasan; Chloe Yong; Dongil Choi; Manoj Joshi; Hyuck Soo Yang; Owen Hu; Srikanth Samavedam; Dong Kyun Sohn (Microelectron. Reliab., 2017)

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. - M. Iqbal Mahmud; Amit Gupta; Maria Toledano-Luque; N. Rao Mavilla; Jeffrey B. Johnson; P. Srinivasan 002; A. Zainuddin; S. Rao; Salvatore Cimino; Byoung Min; Tanya Nigam (IRPS, 2019)

Novel Oxide Top-Off Process Enabling Reliable PC-CA TDDB on IO Devices with Self Aligned Contact. - Tian Shen; Abu Naser Zainuddin; Purushothaman Srinivasan; Zakariae Chbili; Kai Zhao; Patrick Justison (IRPS, 2019)

Silicon Based RF Reliability Challenges for 5G Communications. - Paul Colestock; P. Srinivasan 002; Fernando Guarin (IRPS, 2020)

A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. - P. Srinivasan 002; Paul Colestock; Thomas Samuels; Stephen Moss; Fernando Guarin; Byoung Min (IRPS, 2020)

Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI. - Sameer H. Jain; Dimitri Lederer; Arvind Kumar; Sudesh Saroop; Chris Prindle; P. Srinivasan 002; Wen Liu; Ravi Achanta; Erdem Kaltalioglu; Stephen Moss; Greg Freeman; Paul Colestock (ESSDERC, 2021)

Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications. - Aarti Rathi; P. Srinivasan 002; Fernando Guarin; Abhisek Dixit (IRPS, 2021)

CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. - P. Srinivasan 002; Fernando Guarin (IRPS, 2021)

RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. - P. Srinivasan 002; Fernando Guarin; Shafi Syed; Joris Angelo Sundaram Jerome; Wen Liu; Sameer H. Jain; Dimitri Lederer; Stephen Moss; Paul Colestock; Anirban Bandyopadhyay; Ned Cahoon; Byoung Min; et al. (IRPS, 2021)

Back gate bias effect and layout dependence on Random Telegraph Noise in FDSOI technologies. - P. Srinivasan 002; Da Song; David Rose; Maurice LaCroix; Arunima Dasgupta (IRPS, 2021)

Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications. - Asifa Amin; Aarti Rathi; Sujit K. Singh; Abhisek Dixit; Oscar Huerta-Gonzalez; P. Srinivasan 002; Fernando Guarin (IRPS, 2022)

6G Roadmap for Semiconductor Technologies: Challenges and Advances. - Ned Cahoon; P. Srinivasan 002; Fernando Guarin (IRPS, 2022)

Optimized LDMOS Offering for Power Management and RF Applications. - Salvatore Cimino; J. Singh; Jeffrey B. Johnson; W. Zheng; Y. Chen; W. Liu; P. Srinivasan 002; O. Gonzales; M. Hauser; Matthew Koskinen; K. Nagahiro; Y. Liu; et al. (IRPS, 2022)

Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. - M. Hauser; P. Srinivasan 002; A. Vallett; R. Krishnasamy; Fernando Guarin; Dave Brochu; V. Pham; Byoung Min (IRPS, 2022)

RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. - Aarti Rathi; Abhisek Dixit; P. Srinivasan 002; Oscar Huerta-Gonzalez; Fernando Guarin (IRPS, 2022)

Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies. - P. Srinivasan 002; Fernando Guarin; Enkhbayasgalan Gantsog; Harish Krishnaswamy; Arun Natarajan 001 (IRPS, 2022)

Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. - Dora A. Chaparro-Ortiz; Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Guevara; P. Srinivasan 002; Fernando Guarin (IRPS, 2023)

Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. - Aarti Rathi; Abhisek Dixit; Naga Satish; P. Srinivasan 002; Fernando Guarin (IRPS, 2023)

RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. - P. Srinivasan 002; J. Lestage; Shafi Syed; X. Hui; Stephen Moss; Oscar D. Restrepo; Oscar H. Gonzalez; Y. Chen; T. McKay; Anirban Bandyopadhyay; Ned Cahoon; Fernando Guarin; et al. (IRPS, 2023)

Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. - Alan Y. Otero-Carrascal; Dora A. Chaparro-Ortiz; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002 (IRPS, 2024)

Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers. - P. Srinivasan 002; Oscar H. Gonzalez; Oscar D. Restrepo; J. Lestage; Shafi Syed; W. Taylor; Anirban Bandyopadhyay; Martin Gall; S. Ludvik (IRPS, 2024)

A New Methodology to Evaluate Die-Package Level Load-Pull and Ruggedness for RF Long Term Aging for 5G Applications. - P. Srinivasan 002; Oscar H. Gonzalez; J. Lestage; Stephen Moss; Oscar D. Restrepo; S. Ludvik (IRPS, 2025)

Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications. - Alan Y. Otero-Carrascal; Edmundo A. Gutiérrez-D.; Reydezel Torres-Torres; Oscar Huerta-Gonzalez; P. Srinivasan 002; Héctor Uribe (IRPS, 2025)

Impact of Hot-Carrier Degradation on Flicker Noise (1/f) in 45-nm PD-SOI Floating-Body NFETs. - Shruti Pathak; Aarti Rathi; Abhisek Dixit; P. Srinivasan 002; Oscar H. Gonzalez (IRPS, 2025)